Programme overview
What researchers are suggesting and companies have yet to do
The dramatic increase in electronics content fueled by future products such as e-cars, Internet of Things, LEDs everywhere, medical implants, data centres, combined with a decreasing acceptance of failures, will have a serious impact on current reliability approaches.
The purpose of the seminar is to provide a forum for recognized experts from a wide variety of academia and industry, from component to data centre, from hardware to software, from experimental to numerical analysis, to express their opinions and share their thoughts on various trends and on how to cope with the significant challenges imposed by future requirements. It is expected that at the end of the seminar the attendees will conclude that collaboration in this field is mandatory to keep pace with future technological developments.
The following speakers will contribute to the seminar and will join the discussions during 9 and 10 May. At the end of day one there is a networking dinner. The exact timeline of the programme will be announced at the end of January 2019.
Keynote speaker
- Why we can’t trust our suppliers to deliver reliable products
Michael Pecht (CALCE) – world-renowned expert in strategic planning, design, test and risk assessment of electronics and information systems
Invited speakers and their topics
- Reliability challenges in data centres
Martien Arts – director mission critical facilities at Royal Haskoning DHV - Reliability challenges and opportunities of leading edge interconnects
Dr. Kristof Croes – group leader interconnect reliability, test and modeling at imec - Design for reliability toolset at Signify
Prof. dr. ir. Willem van Driel – reliability master at Signify, professor at Delft University of Technology - Challenges in outer space reliability
Ir. Johannes van Es – senior research manager at national aerospace laboratory NLR - Title to be announced
Ir. Frits Gehring – manager EDS at Philips Innovation Services - Advances in numerical simulations for reliability predictions of automotive electronics
Dr. Przemyslaw Jakub Gromala – automotive electronics, modeling, simulation and product optimization at Robert Bosch - Software reliability
Prof. dr. Marieke Huisman – professor in software reliability, leading the Formal Methods and Tools group at the University of Twente - Reliability improvement for components
Ir. John Janssen – technical director at NXP Semiconductors - Trends and challenges in reliability: consequences for thermal management
Ir. Clemens Lasance – Philips Research emeritus - Challenges in battery reliability
Prof. dr. ir. Peter Notten – professor in battery management systems at Eindhoven University of Technology - Challenges in CFD to improve accuracy
Dr. John Parry – senior industry marketing manager at Mentor Graphics - High-accuracy testing
Dr. Andras Poppe – business development manager at Mentor Graphics, associate professor at Budapest University of Technology and Economics - Title to be announced
Dr. ir. René Rongen – fellow at NXP Semiconductors - How to deal with chip-package, package-board and board-system interactions for future electronic systems reliability
Dr. Bart Vandevelde – R&D project leader at Imec - Challenges and solutions of reliability modeling
Prof. dr. ir. Guoqi Zhang – professor at Delft University of Technology
Programme committee / initiative
Willem van Driel (Signify)
Clemens Lasance (emeritus Philips Research)
René Raaijmakers (High Tech Institute)
Ronald Schop (Holland Innovative)
Guoqi Zhang (Delft University of Technology)