9 May 2019, 10:40-11:00
Kristof Croes has an MSc in physics and an MSc in biostatistics. Also, he obtained a PhD dealing with the development of statistical techniques for planning reliability experiments. After his PhD, he joined the reliability business unit of XPEQT, first as the software responsible and then as the manager of the R&D. From 2002 till end 2006, he was the product and application manager of the package-level reliability products of the Singapore-based company Chiron Holdings. Beginning 2007, he went back to research, working as a BEOL reliability engineer in Imec. Currently, he is the group leader of the Reliability, Electrical test and Modeling group working on test, characterization (electrical, thermal and (thermo-)mechanical) and reliability with the main focus on advanced interconnects (2D, 3D, OIO). He was an (invited/tutorial) speaker at several leading-edge semiconductor conferences (IRPS, IITC, IEDM, …). He also (co-)authored >100 papers in the field of reliability.