Willem van Driel

Towards a digital twin for lighting systems

9 May 2019, 11:00-11:40

Reliability is an essential scientific and technological domain intrinsically linked with system integration. Nowadays, semiconductor industries are confronted with ever-increasing design complexity, dramatically decreasing design margins, increasing chances for and consequences of failures, shortening of product development and qualification time, and increasing difficulties to meet quality, robustness and reliability requirements. The scientific successes of many micro/nano-related technology developments cannot lead to business success without innovation and breakthroughs in the way that we address reliability through the whole value chain. The ultimate aim of reliability is to predict, optimize and design upfront the reliability of micro/nanoelectronics and systems, an area denoted as ‘Design for Reliability (DfR)’. While virtual schemes based on numerical simulation are widely used for functional design, they lack a systematic approach when used for reliability assessments. Besides this, lifetime predictions are still based on old standards (MIL, FIDES, Telcordia, etc.) assuming a constant failure rate behaviour. Here, the so-called digital twin comes into sight, which is no more than just a mathematical model of a physical object. In this talk, I will present the reliability approach at Signify. It includes the use of an in-house developed toolset, widely deployed failure mode descriptions and the extensive use of acceleration tests using knowledge based qualification methods.

Willem van Driel graduated as a mechanical engineering at Eindhoven University of Technology and received a PhD degree from Delft University of Technology, the Netherlands. He has a >25 year track record in the reliability domain. Application areas range from healthcare to gas and oil explorations and semiconductors. In his current position at Signify (formerly Philips Lighting) he is responsible for solid-state lighting reliability. Besides that he holds a professor position at Delft University. His scientific interests are solid-state lighting, microelectronics and microsystems technologies, virtual prototyping, virtual reliability qualification and designing for reliability of microelectronics and microsystems. He is chair of the organizing committee of the IEEE conference EuroSimE and has served as guest editor for several journals (eg Microelectronics Reliability and IEEE Transactions on Components and Packaging Technologies). He has authored and co-authored more than 300 scientific publications, including journal and conference papers, book and book chapters and invited keynote lectures. He holds 15 patents.